藤井 茉美
Mami N. Fujii

Assistant Professor
Information Device Science Laboratory
Graduate School of Materials Science
Nara Institute of Science and Technology
8916-5 Takayama, Ikoma, Nara 630-0192, JAPAN

Tel: +81-743-72-6063
Fax: +81-743-72-6069


Education

2015.7 奈良先端科学技術大学院大学 物質創成科学研究科 助教
2014.1 奈良先端科学技術大学院大学 物質創成科学研究科 特任助教
2012.4 Panasonic株式会社
2012.3 奈良先端科学技術大学院大学 物質創成科学研究科 博士後期課程修了
(2009-2012 日本学術振興会特別研究員 DC1)
2009. 3 奈良先端科学技術大学院大学 物質創成科学研究科 博士前期課程修了
2007. 3 神戸市立工業高等専門学校 電気電子工学専攻 卒業


Honors and Grants
2017 第8回(2017年度) 女性研究者研究業績・人材育成賞(小舘香椎子賞), 2017 応用物理学会
2011 Young Resercher Award, 2010 International Conference on Solid State Devices and Materials
2009 - 2012 Research Fellowships for Young Scientists, Japan Society for the Promotion of Science (2100,000 yen)
2008 Competitive Research Grant from Graduate School (500,000 yen)
2008 Best Student Award, The Fifteenth International Workshop on Active- Matrix Flatpanel Displays and Devices
2006 Best Student Award, The Institute of Electrostatics Japan Spring Meeting
2005 Award, Institute of Electrical Engineers of Japan, Kansai-section joint Convention
2005 Best Oral Presentation Award, Industry-academic-government Technical Forum'05


Publications (For the latest list, please click here)
15. Juan Paolo S. Bermundo, Yasuaki Ishikawa, Mami N. Fujii, Hiroshi Ikenoue, and Yukiharu Uraoka
"H and Au diffusion in high mobility a-InGaZnO thin-film transistors via low temperature", Applied Physics Letters, 107, 33504 (2017)
14. Mami N. Fujii, Yasuaki Ishikawa, Ryoichi Ishihara, Johan van der Cingel, Mohammad R. T. Mofrad, Juan Paolo Soria Bermundo, Emi Kawashima, Kazushige Tomai, Koki Yano, Yukiharu Uraoka
"Nano-crystallization in ZnO-doped In2O3 thin films via excimer laser annealing for thin-film transistors", AIP Advances, 6, 65216 (2016)
13. Chaiyanan Kulchaisit, Yasuaki Ishikawa, Mami N. Fujii, Haruka Yamazaki, Juan Paolo Soria Bermundo, Satoru Ishikawa, Takaaki Miyasako, Hiromitsu Katsui, Kei Tanaka, Ken-ichi Hamada, Masahiro Horita, and Yukiharu Uraoka
"Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation", Journal of Display Technology, 12, 3, 263-267 (2016).
12. Kahori Kise, Mami N. Fujii, Satoshi Urakawa, Haruka Yamazaki, Emi Kawashima, Shigekazu Tomai, Koki Yano,Dapeng Wang, Mamoru Furuta, Yasuaki Ishikawa, and Yukiharu Uraoka
"Self-heating induced instability of oxide thin film transistors under dynamic stress", Appl. Phys. Lett., 108 , 023501 (2016).
11. Juan Paolo Bermundo, Yasuaki Ishikawa, Mami N. Fujii, Toshiaki Nonaka, Ryoichi Ishihara, Hiroshi Ikenoue, and Yukiharu Uraoka
"Effect of excimer laser annealing on a-InGaZnO thin-film transistors passivated by solution-processed hybrid passivation layers", Journal of Physics D: Applied Physics, 49, 035102 (2016)
10. Mami N. Fujii, Yasuaki Ishikawa, Kazumoto Miwa, Hiromi Okada, Yukiharu Uraoka & Shimpei Ono
"High-density carrier-accumulated and electrically stable oxide thin-film transistors from ion-gel gate dielectric", Scientific Reports, 5, 18168 (2015)
9. Juan Paolo Bermundo, Yasuaki Ishikawa, Haruka Yamazaki, Toshiaki Nonaka, Mami N. Fujii, and Yukiharu Uraoka
"Highly reliable photosensitive organic-inorganic hybrid passivation layers for a-InGaZnO thin-film transistors", Applied Physics Letters, 107, 33504 (2015)
8. Jun Tanaka, Yoshihiro Ueoka, Koji Yoshitsugu, Mami Fujii, Yasuaki Ishikawa, Yukiharu Uraoka, Kazushige Takechi, and Hiroshi Tanabe
"Comparison between Effects of PECVD-SiOx and Thermal ALD-AlOx Passivation Layers on Characteristics of Amorphous InGaZnO TFTs", ECS Journal of Solid State Science and Technology, 4, Q3050 (2015)
7. Mami N. Fujii, Yasuaki Ishikawa, Masahiro Horita, and Yukiharu Uraoka
"Vapor-Induced Improvements in Field Effect Mobility of Transparent a-IGZO TFTs", ECS Journal of Solid State Science and Technology, 3, Q3050 (2014)
6. Yoshihiro Ueoka, Yasuaki Ishikawa, Juan Paolo Bermundo, Haruka Yamazaki, Satoshi Urakawa, Mami Fujii, Masahiro Horita, and Yukiharu Uraoka
"Density of States in Amorphous In-Ga-Zn-O Thin-Film Transistor under Negative Bias Illumination Stress", ECS Journal of Solid State Science and Technology, 3, Q3001 (2014)
5. Haruka Yamazaki, Yasuaki Ishikawa, Mami Fujii, Yoshihiro Ueoka, Masaki Fujiwara, Eiji Takahashi, Yasunori Ando, Naoyuki Maejima, Hirosuke Matsui, Fumihiko Matsui, Hiroshi Daimon, and Yukiharu Uraoka
"The Influence of Fluorinated Silicon Nitride Gate Insulator on Positive Bias Stability Toward Highly Reliable Amorphous InGaZnO Thin-Film Transistors", ECS Journal of Solid State Science and Technology, 3, Q20-Q23 (2013)
4. Mami Fujii, Yasuaki Ishikawa, Ryoichi Ishihara, Johan can der Chingel, Mohammad R. T. Mofrad, Masahiro Horita, and Yukiharu Uraoka
"Low temperature high-mobility InZnO thin-film transistors fabricated by excimer laser annealing", Appl. Phys. Lett., 102, 122107 (2013)
3. Mami Fujii, Yasuaki Ishikawa, Masahiro Horita, and Yukiharu Uraoka
"Unque Phenomenon in Degradation of Amorphous In2O3-Ga2O3-ZnO Thin-Film Transistors under Dynamic Stress", Appl. Phys. Express, 4, 104103 (2011)
2. Mami FUJII, Yukiharu URAOKA, Takashi FUYUKI, Ji Sim JUNG, Jang Yeon KWON,
"Experimental and Theoretical Analysis of Degradation in Ga2O3–In2O3–ZnO Thin-Film Transistors", Jpn. J. Appl. Phys., 48, 04C091, (2009)
1. Mami Fujii, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki, Ji Sim Jung, Jang Yeon Kwon,
"Thermal Analysis of Degradation in Ga2O3-In2O3-ZnO Thin Film Transistors", Jpn. J. Appl. Phys., 47, No.8, pp.6236-6240 (2008)


Proceedings
1. Mami Fujii Tomoki Maruyama, Masahiro Horita, Kiyoshi Uchiyama, Ji Sim Jung, Jang Yeon Kwon, Yukiharu Uraoka,
"Electrical and thermal stress analysis of In2O3-Ga2O3-ZnO thin-film transistors", MRS Symp. Proc., 1201, 1201-H05-11, (2010)

Presented Works

International conferences
14. Mami Fujii, Yoshihiro Ueoka, Haruka Yamazaki, Masahiro Horita, Yasuaki Ishikawa and Yukiharu Uraoka,
"Improvement of a-IGZO TFT Perfoemance by High Pressure Vapor Annealing", International Thin-Film Transistor Conference, Lisbon Univ., Portugal, January 2012
13. Mami Fujii, Yasuaki Ishikawa, Masahiro Horita, and Yukiharu Uraoka,
"Transient Analysis of the Dynamic Stress Degradation in a-IGZO TFTs", The 11th International Meeting on Information Display, Soul, Korea, Octorber 2011
12. Mami Fujii, Ryoichi Ishihara, Tao Chen, Johan van der Cingel, Mohammad R.T. Mofrad, Masashi Kasami, Koki Yano, Yasuaki Ishikawa, Yukiharu Uraoka,
"Effects of Excimer Laser Annealing of Transparent Oxide Semiconductor Films", 2010 Materials Research Society Fall Meetings, Boston, MA, USA, November 2010
11. M.Fujii, J. S. Jung, J. Y. Kwon and Y. Uraoka,
"The Unique Phenomenon in the Amorphous In23-Ga23-ZnO TFTs Degradation under the Dynamic Stress", 2010 International Conference on Solid State Devices and Materials, The University of Tokyo, Japan, September 2010
10. M.Fujii, Ji Sim Jung, Jang, Yeon Kwon, Yukiharu Uraoka,
"Electrical and thermal stress analysis of In2O3-Ga2O3-ZnO Thin-Film Transistor", Materials Research Society Fall Meetings, Bostom MA, USA, November 2009 (Poster)
9. M.Fujii, Takashi Fuyuki, Ji Sim Jung, Jang Yeon Kwon, and Yukiharu Uraoka,
"Analysis and Improvement of Reliability in IGZO TFT for Next Generation Display", 9th International Meeting on Information Display, Seoul, Korea, October 2009 (Invited)
8. M.Fujii, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki, Ji Sim Jung, Jang Yeon Kwon, Takashi Nakanishi, Mutsumi Kimura,
"Degradation in Ga2O3-In2O-ZnO thin film transistor", The 2008 International Meeting for Future of Electron Devices, Kansai, Osaka Univ., Japan, May 2009 (Poster)
7. M.Fujii, Yukiharu Uraoka, Takashi Fuyuki, Ji Sim Jung, Jang Yeon Kwon,
"Experimental and Theoretical Analysis of In2O3-Ga2O3-ZnO Thin Film Transistors under Constant Voltage Stress", The 5th International Thin Film Transistor Conference 2009, Ecole Polytechnique, France, March 2009
6. Mami Fujii, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki, Ji Sim Jung, Jang Yeon Kwon, Takashi Nakanishi, Mutsumi Kimura,
"Threshold Voltage Shift in Ga2O3-In2O3-ZnO (GIZO) Thin Film Transistors under Constant Voltage Stress", The 2008 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Octorber 2008
5. Mami Fujii, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki, Nobuyoshi Taguchi, Ryuichi Sugie, Naoki Muraki,
"New Synthesis Method using Microwave Thermo Catalysis for Inorganic EL Displays", 2008 The Fifteenth International Workshop on Active- Matrix Flatpanel Displays and Devices, Tokyo, Japan, July 2008
4. Mami Fujii, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki, Ji Sim Jung, Jang Yeon Kwon, Takashi Nakanishi, Mutsumi Kimura,
"Degradation in Ga2O3-In2O3-ZnO thin film transistors under Constant Voltage Stress", 2008 The Fifteenth International Workshop on Active- Matrix Flatpanel Displays and Devices, Tokyo, Japan, July 2008
3. Mami Fujii, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki, Ji Sim Jung, Jang Yeon Kwon, Takashi Nakanishi, Mutsumi Kimura,
"Degradation in Ga2O3-In2O-ZnO thin film transistor", The 2008 International Meeting for Future of Electron Devices, Kansai, Osaka Univ., Japan, May 2008 (Poster)
2. N. Taguchi, T. Matsumura-Inoue, M. Fujii and Y. Uraoka,
"New inorganic Phosphor Synthetic Method by Microwave Thermo-Catalysis", The 14th International Display Workshops, Sapporo, Japan, December 2007
1. M.Fujii and T.Fujii,
"Treatment of NOx by the Barrier Discharge Reactor", HAKONE Ⅹ, Saga Univ., Japan, September 2006

国内学会 (Japanese)
9. 藤井茉美, 石原良一, Tao Chen, Johan van der Cingel, Mohammad R. T. Mofrad, 笠見雅司,矢野公規, 堀田昌宏,石河泰明,浦岡行治,
"エキシマレーザーアニールによるIZO TFTの特性改善", 第回59応用物理学関係連合講演会, 早稲田大学,3月,2012年
8. 藤井茉美, 上岡義弘, 山崎はるか, 堀田昌宏, 石河泰明, 浦岡行治,
"高圧水蒸気熱処理によるa-IGZO特性改善効果", 第回59応用物理学関係連合講演会, 早稲田大学,3月,2012年
7. 藤井茉美, 石原良一, Tao Chen, Johan van der Cingel, Mohammad R. T. Mofrad, 笠見雅司,矢野公規, 石河泰明,浦岡行治,
"酸化物半導体薄膜へのエキシマレーザーアニール効果", 第72回応用物理学会学術講演会, 山形大学,9月,2011年
6. 藤井茉美,石原良一,Tao Chen, Johan van der Cingel, Mohammad R. T. Mofrad, 笠見雅司,矢野公規,石河泰明,浦岡行治
"In2O3, IZO薄膜へのエキシマレーザーアニール効果", 薄膜材料デバイス研究会, 奈良,11月,2010年
5. 藤井茉美, 堀田昌宏,石河泰明,浦岡行治,
"a-IGZO TFTのAC電圧ストレスによる不安定性", 第71回応用物理学会学術講演会, 長崎大学,9月,2010年
4. M. Fujii, H. Yano, T. Hatayama, Y. Uraoka, T. Fuyuki, J. S. Jung, J. Y. Kwon, T. Nakanishi, M. Kimura,
"Threshold Voltage Shift in Ga2O3-In2O3-ZnO (GIZO) Thin Film Transistors under Constant Voltage Stress", 第9回関西コロキアム電子デバイスワークショップ, 関西大学, 9月, 2009年 (Invited)
3. 藤井茉美,浦岡行治,矢野裕司,畑山智亮,冬木隆,
"ZnO/SiO2 薄膜界面における高圧水蒸気アニール処理効果", 第56回応用物理学関係連合講演会, 筑波大学, 3月, 2009年
2. 藤井茉美, 矢野裕司, 畑山智亮, 浦岡行治, 冬木隆, Ji Sim Jung, Jang Yeon Kwon,
"Ga2O3-In2O3-ZnO (GIZO) 薄膜を用いた薄膜トランジスタの劣化", 電子情報通信学会 シリコン材料・デバイス(SDM)研究会, 琉球大学, 4月, 2008年
1. 藤井茉美,浦岡行治,矢野裕司,畑山智亮,冬木隆,田口信義,
"マイクロ波熱触媒法を用いた無機EL用蛍光体の合成", 第55回応用物理学関係連合講演会, 日本大学, 3月, 2008年

Research Interests

Electronic devices, Oxide semiconductors


Activities

The Japan Society of Applied Physics
IEEE Electron Device Society