NAISTResearch Facilities
Transmission Electron Microscope (TEM)
Secondary Ion Mass Spectrometer (SIMS)
X-ray macromolecular structure analysis system
(Rigaku UltraX 18/R-AXIS IV)
600MHz Superconductive NMR
500MHz Superconductive NMR
400MHz Superconductive NMR
EI, CI, FAB, ESI, APCI Mass Spectrometer
Time-Of-Flight Mass Spectrometer (TOF-MS)
Microwave Induced Plasma Mass Spectrometer (MIP-MS)
Differential scanning calorimetry (DSC)
Field Emission Scanning Electron Microscope (FE-SEM)
Nanoprobe surface analytical system (EDS)
X-ray Photoelectron Spectroscope (ESCA, XPS)/ Auger Electron Spectroscope (AES)
Scanning Tunneling Microscope (STM)
Scanning Probe Microscope (SPM)
Atomic Force Microscope (AFM)·Near-field Scanning Optical Microscope (NSOM)
Confocal laser microscope
Surface Plasmon Resonance analysis system
Laser zeta potential analyzer
Stylus-type surface profilometer
Spectroscopic ellipsometer
Laser Raman spectrophotometer
Circular Dichromism (CD)
Ultrafast spectroscope using femtosecond laser pulses (100fs)
Vacuum vapor deposition apparatus
Oxide complex thin film coating apparatus
High purity metal spatter
Focused ion beam fabrication systems (FIB)
Metal Organic Chemical Vapor Deposition equipment (MOCVD)
Page up