Equipment

InstrumentManufacturer and model
Microscopes and TEM
specimen preparation
instruments
300kV-Transmission Electron Microscope (300kV-TEM) JEOL
JEM-3100FEF
200kV-Transmission Electron Microscope (200kV-TEM) JOEL,JEM-2200FS
Scanning Transmission Electron Microscope (STEM) HITACHI,HD-2700
Ultra High Resolution Field Emission Scanning Electron Microscope (UHR FE-SEM) HITACHI,SU9000
Low Vacuum Scanning Electron Microscope HITACHI,SU6600
Nano-probing System HITACHI,nanoEBAC NE-4000
Scanning Probe Microscope(SPM) HITACHI,SPA400 and SPI3800N
X-ray diffraction
instruments
Micro Crystal X-ray Structure Analysis Rigaku
ValiMax RAPID
X-ray Structure Analyzer under preparation of new machine
Micro Crystal X-ray Structure Analysis Rigaku,Micro/Max-007HF
Mass spectrometers High-Resolution MALDI-TOF Mass Spectrometer JEOL
spiralTOF,JMS-S3000
MALDI-TOF Mass Spectrometer Bruker
Autoflex II
Double-focusing Mass Spectrometer(EI,CI, FAB) JEOL,JMS-700
Electrospray ionization (ESI) High Resolution Time-of-Flight Mass Spectrometer JEOL, AccuTOF,JMS-T100LC
Nuclear magnetic
resonance and electron
spin resonance
instruments
Nuclear Magnetic Resonance (NMR) JEOL,JNM-ECA600(600MHz)
JEOL,JNM-ECX500(500MHz)
400MHz Solid-state Nuclear Magnetic Resonance (Solid-state NMR) JEOL,JNM-ECX400P
Electron Spin Resonance (ESR) JEOL,JES-FA100N
Surface analysis instruments X-ray Photoelectron Spectroscopy (XPS) ULVAC-PHI
PHI 5000 VersaProbeII
Electron Probe Microanalyzer (EPMA) Shimadzu,EPMA1610
Secondary Ion Mass Spectrometry (SIMS) ULVAC-PHI,ADEPT-1010
Optical measurement
instruments
Laser Raman Spectrometer JASCO,NRS-4100-30
Circular Dichroism spectrometer(CD) JASCO,J-725
Dynamic Light Scattering Measurement Otsuka Electronics,DLS-6000
Spectroscopic Ellipsometer HORIBA Jobin Yvon, UVISEL ER AGMS-NSD
Photoluminescence Lifetime Measurement System (Ti:Sapphire Laser, Nitrogen Laser, Streak Scope) Coherent, Mira; Usho, KEC-160; Hamamatsu Photonics, C4780
Elemental analysis instruments Elemental Analysis (EA) Perkin Elmer,2400ⅡCHNS/O
Physical properties
measurement instruments
Photoelectron Yield Spectroscopy (PYS) Riken Keiki
AC-3
Internal Quantum Efficiency Measurement System Bunkoukeiki
CEP-2000RP
Physical Property Measurement System (PPMS) Quantum Design
EverCool II
Differential Scanning Calorimeter (DSC) / Simultaneous Thermogravimetric Analyzer (TG-DTA) Hitachi,DSC7000X、STA7200
Surface Profiler Surface Profiler Kosaka Laboratory,ET200