奈良先端科学技術大学院大学 物質創成科学領域

Summary

Presentation title

Noncontact AFM Potentiometry for Nanoscale Potential Imaging via Distance-Derivative Capacitance Analysis

Authors

Gilbert Lamtecson Pado, Eiichi Taji, Ryota Fukuzawa, Hiroaki Benten, and Masakazu Nakamura*

Research detail

This study advances atomic force microscope potentiometry (AFMP), a promising technique for analyzing local electrical potentials in operating semiconductor devices, by developing non-contact AFMP for nanoscale potential mapping. Conventional AFMP requires physical contact and is therefore difficult to apply to fragile samples such as carbon-nanotube thermoelectric materials. By using distance-derivative capacitance analysis to suppress parasitic capacitance contributions during noncontact measurements, the new method provides clear nanoscale potential distributions. Our results demonstrate its potential as a non-contact electrical-potential measurement technique for fragile nanomaterials and operating devices.

Comment

I am truly grateful and deeply honored for the opportunity to present our work and to receive the Best Student Poster Award at NC-AFM 2026. It was also a valuable experience to learn from and connect with researchers from around the world working in AFM, surface science, nanoscience and related fields. I would like to express my sincere appreciation to Professor Masakazu Nakamura, Associate Professor Hiroaki Benten and Assistant Professor Ryota Fukuzawa, as well as my co-author Eiichi Taji and the other members of the Organic Electronics Laboratory at NAIST, for their invaluable guidance, encouragement, and continued support throughout my research.