Laboratory for Supramolecular Science (Hirota Lab.)

The instruments we use are listed below.

・ FT NMR Spectrometers, JNM-ECP 600 JEOL.
Measurement of diffusion coefficient of the supramolecuar assembly is possible using the diffusion probes.

600MHz 核磁気共鳴装置（NMR）

・ Resonance Raman System, NRS-1800, JASCO.
The instrument is equipped with an Ar+ laser (457.9-514.5 nm), a dye laser, and a Ti:Sapp laser.

・ Raman Spectroscopy System, NRS-2100, JASCO.
The instrument is equipped with a Kr laser (413 nm) and an Ar+ laser (514.5 nm)

共鳴ラマン分光光度計

・ ESR Spectrometers, JES-FA 100, JEOL.
The instrument is equipped with a Xe lamp (500W) or a High pressure Hg lamp (500W).

電子スピン共鳴測定装置（ESR）

・ Fourier Transform Infrared (FTIR) Spectrometer, FT/IR-6100V, JASCO
The instrument is equipped with a step-scan unit for time-resolved measurements.

・ Fourier Transform Infrared (FTIR) Spectrometer, Avatar-320, ThermoNicolet.
Avatar-320 is equipped with an ATR.

・ Circular Dichroism Spectropolarimeter, J720, JASCO.
J720 is equipped with a variable temperature bath or a magnet for MCD

円偏光二色性測定装置

・ UV-Vis-NIR Spectrophotometer, UV-2500PC, Shimadzu.

・ Fluorescence Spectrophotometer, F-4500, Hitachi.
F-4500 is equipped with an optional photomultipier for longer wavelength (200-900 nm).

・ Nanosecond Transient Absorption Measurement System, TSP-601, Unisoku Scientific Instruments.
TSP-601 is equipped with a dye laser / Nd-YAG laser.

ナノ秒過渡吸収測定装置

・ MALDI-TOF Mass Spectrometer, Voyager-DE STR, Applied-Biosystems, AutoflexII, Bruker.

MALDI-TOF-MS質量分析装置

・ Mass Spectrometer, JMS-700 (MStation), JEOL. EI, CI, FAB and ESI mode

二重集束型磁場型熱量計

・ Microwave Induced Plasma Mass Spectrometer, MIP-MS P-6000, Hitachi.

・ Gas Chromatograph-Mass Spectrometer (GC-MS), JMS-AMSUN, JEOL.

GC-MS質量分析装置

・ Scanning Probe Microscope, Nanoscope IIIa with maltimode, Digital Instruments/ Veeco.
contact AFM, tapping AFM, STM, and conductive AFM mode.

高感度走査プローブ顕微鏡

・ Scanning Probe Microscope, SPI-3800N with SPA-400, Seiko Instruments.
contact AFM, tapping AFM, STM, and conductive AFM mode.

走査型プローブ顕微鏡（AFM、STM)

・ Scanning Probe Microscope, Explorer, Thermomicroscope / Veeco.
contact AFM and tapping AFM

・ Near-Field Scanning Optical Microscope (NSOM), Aurora-2, Thermomicroscope / Veeco.

・ Confocal Laser Scanning Microscope, LSM 510, Carl Zeiss.
LSM510 is equipped with UV laser, Ar laser, and He/Ne laser.

共焦点レーザー顕微鏡（紫外・可視レーザー）

・ Confocal Laser Scanning Microscope, Nanofinder, Tokyo Instruments, Inc.
Fluorescence Spectrophotometer, AFM.

高感度共焦点レーザー顕微蛍光分光光度計

・ Field Emission Scanning Electron Microscope, S-4160, Hitachi.
The microscope is equipped with a digital energy dispersive X-ray (EDX) detector.

電界放射型走査形電子顕微鏡（FESEM)

・ Scanning Electron Microscope for natural samples, S-3500N, Hitachi.
The instrument is equipped with a digital energy dispersive X-ray (EDX) detector.
・ Fluorescence Microscope with Spectrophotometer, Olympus & Hamatsu photonics.